Brought to you by the
Research Group of
Prof. Robert M. Corn
at the Dept. of Chemistry, University of California, Irvine.
This page is for calculating the reflectivity (R) of p-polarized and s-polarized light as a function of incident angle (t) from a four phase thin film dielectric stack. These calculations are used in predicting the shift in the SPR angle (i.e., the angle at which a minumum in reflectivity is observed in an SPR scanning angle experiment. The four phases are typically:
For this calculation, you need to supply the angle range over which you wish to perform the calculation, the wavelength of light used in the SPR experiment, the indices of refraction for the 4 phases, and the thicknesses of the two thin films. The prism can only have a real index of refraction, but all of the other phases can be complex (i.e., absorbing). If you don't know the indices of refraction, we have created tables of gold, BK-7, and SF-10, indices of refraction for wavelengths between 500 nm and 2000 nm. The default indices in the form are for BK-7 and gold at the HeNe laser wavelength of 632.8 nm.
The calculations closely follow those published in the article by Wilford Hansen, J. Opt. Soc. Am. 1968, 58, 380-390. Although the equations follow Hansen's N-phase method, this particular calculation is written to perform only a 4-phase calculation. For more information or a copy of the complete N-phase calculation code, please see our Calculations Page.
To run this calculation, just fill out the form items below and hit the "Submit Parameters" button. Your input data will then be saved, and the calculated t-R data will be returned in an x-y table.
Good Luck! If you run into any problems, please email us at: email@example.com